搜索包含 Harriet N. TOEFL (Test of English as a foreign language) 的图书 - 暨南大学图书馆

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	English idioms in use 0 索取号：H313/E20031 作者：McCarthy、 Michael、 1947-、O'Dell、 Felicity、 1947-、出版社：Cambridge : Cambridge University Press, 2002.		Consciousness emerging : the dynamics of perception, imagination, action, memory, thought, and language 0 索取号：B842.7/E20031 作者：Bartsch、 Renate、 1939-、出版社：Amsterdam ; Philadelphia, Pa. : John Benjamins Pub., 2002.
	Man in structure & function 0 索取号：Q98/E601 作者：Kahn、 Fritz、 1888-1968、Rosen、 George、 1910-1977、Kahn、 Fritz、 1888-1968. Mensch gesund und krank. English、出版社：New York : A. A. Knopf, 1943		A mycological English-Latin glossary 0 索取号：Q949.32-61/E701 作者：Cash、 Edith K. (Edith Katherine)、 1890-、出版社：New York : Published for the New York Botanical Garden in collaboration with the Mycological Society of America [by] Hafner Pub. Co., 1965
	MCSE test success. Internet Information Server 4 0 索取号：TP393.4/E991 作者：Donald、 Lisa.、出版社：Beijing : Publishing House of Electronics Industry, 1999.		MCSE test success : Windows 98 0 索取号：TP316.7/E991 作者：出版社：Beijig : Publishing House of Electronics Industry 1999
	Business English essentials 0 索取号：H31/E995.8 作者：Voiles、 Price R.、Henderson、 Greta La Follette Whiteside、 1901- Business English essentials.、出版社：Beijing China Machine Press c1998.		Interpreting ECGs : an advanced self-test guide 0 索取号：R540.4/E9010 作者：Haddad、 Ali、 1943-、Dean、 David C.、出版社：Oradell, N.J. : Medical Economics Co., Book Division, 1981.
	UML'98-the unified modeling language : beyond the notation : First International Workshop, Mulhouse, France, June 3-4, 1998 : proceedings 0 索取号：TP311.5/E20014/1998 作者：UML '98 (1998 : Mulhouse、 France)、B́Еzivin、 J. (Jean)、Muller、 Pierre-Alain.、出版社：New York : Springer-Verlag, 1999.		Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 0 索取号：TM93-53/E902/11 作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
	Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 0 索取号：TM93-53/E901/1982 作者：International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、出版社：Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.		Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 0 索取号：TM93-53/E901/1983 作者：International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.
	Complete guide to digital test equipment 0 索取号：TM932/E801 作者：Buchsbaum、 Walter H.、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1977.		Modern electronic test equipment 0 索取号：TM93/E902 作者：Brindley、 Keith.、出版社：London : Heinemann, 1986.
	Electronic test equipment : operation and applications 0 索取号：TM93/E901 作者：出版社：London ; New York : Granada ; [Brookfield, Vt. : Distributed by Renouf USA], 1981.		Teaching modern foreign languages at advanced level 0 索取号：H09/E9912 作者：Pachler、 Norbert.、出版社：New York : Routledge, 1999.

	English idioms in use 0 索取号：H313/E20031 作者：McCarthy、 Michael、 1947-、O'Dell、 Felicity、 1947-、出版社：Cambridge : Cambridge University Press, 2002.		Consciousness emerging : the dynamics of perception, imagination, action, memory, thought, and language 0 索取号：B842.7/E20031 作者：Bartsch、 Renate、 1939-、出版社：Amsterdam ; Philadelphia, Pa. : John Benjamins Pub., 2002.
	Man in structure & function 0 索取号：Q98/E601 作者：Kahn、 Fritz、 1888-1968、Rosen、 George、 1910-1977、Kahn、 Fritz、 1888-1968. Mensch gesund und krank. English、出版社：New York : A. A. Knopf, 1943		A mycological English-Latin glossary 0 索取号：Q949.32-61/E701 作者：Cash、 Edith K. (Edith Katherine)、 1890-、出版社：New York : Published for the New York Botanical Garden in collaboration with the Mycological Society of America [by] Hafner Pub. Co., 1965
	MCSE test success. Internet Information Server 4 0 索取号：TP393.4/E991 作者：Donald、 Lisa.、出版社：Beijing : Publishing House of Electronics Industry, 1999.		MCSE test success : Windows 98 0 索取号：TP316.7/E991 作者：出版社：Beijig : Publishing House of Electronics Industry 1999
	Business English essentials 0 索取号：H31/E995.8 作者：Voiles、 Price R.、Henderson、 Greta La Follette Whiteside、 1901- Business English essentials.、出版社：Beijing China Machine Press c1998.		Interpreting ECGs : an advanced self-test guide 0 索取号：R540.4/E9010 作者：Haddad、 Ali、 1943-、Dean、 David C.、出版社：Oradell, N.J. : Medical Economics Co., Book Division, 1981.
	UML'98-the unified modeling language : beyond the notation : First International Workshop, Mulhouse, France, June 3-4, 1998 : proceedings 0 索取号：TP311.5/E20014/1998 作者：UML '98 (1998 : Mulhouse、 France)、B́Еzivin、 J. (Jean)、Muller、 Pierre-Alain.、出版社：New York : Springer-Verlag, 1999.		Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 0 索取号：TM93-53/E902/11 作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
	Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 0 索取号：TM93-53/E901/1982 作者：International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、出版社：Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.		Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 0 索取号：TM93-53/E901/1983 作者：International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.
	Complete guide to digital test equipment 0 索取号：TM932/E801 作者：Buchsbaum、 Walter H.、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1977.		Modern electronic test equipment 0 索取号：TM93/E902 作者：Brindley、 Keith.、出版社：London : Heinemann, 1986.
	Electronic test equipment : operation and applications 0 索取号：TM93/E901 作者：出版社：London ; New York : Granada ; [Brookfield, Vt. : Distributed by Renouf USA], 1981.		Teaching modern foreign languages at advanced level 0 索取号：H09/E9912 作者：Pachler、 Norbert.、出版社：New York : Routledge, 1999.